International School on
Structural characterization of nanostructures
25 – 27 January 2007
Aveiro, Portugal
Abstracts submission/Presentation
The characterization of nanostructures is a key issue in all technological applications of nanostructured materials as well as a fundamental research tool for many scientists working in a variety of fields including Physics, Chemistry, Biology, Materials Science and Engineering.
This School on structural characterization of nanostructures will address techniques such as X-ray diffraction and scattering, ex situ and in situ high resolution electron microscopy, scanning probe microscopy, optical and ion beam methods at a graduate and post-graduate level. This School will also provide a unique forum between young researchers, technologists and leading scientists working in this area.
This School is organised by the University of Aveiro pole of I3N (a Portuguese Associate Laboratory in Nanoscience and Nanotechnology) and in the framework of the European Network of Excellence SANDiE (Self-Assembled semiconductor Nanostructures for new Devices in photonics and Electronics) in which the Aveiro Research Team is a member.News:
the registration and submission of abstracts is closed
M. C. Carmo
N. Sobolev
A. J. Neves
T. Monteiro
J. P. Leitão
M. J. Soares
Fax: +351 234 424 965
